Events
![Algonquin College - School of Advanced Technology Career Fair @ Algonquin College | Ottawa | Ontario | Canada](https://www.ieeeottawa.ca/wp-content/uploads/2019/05/Screen-Shot-2019-05-03-at-9.10.21-PM-300x212.png)
Career Fair
Algonquin College – School of Advanced Technology
MORE THAN 40 PART-TIME FACULTY POSITIONS AVAILABLE
SATURDAY, MAY 25, 2019
9am to 1pm
Join the learner-driven workforce of one of the National Capital Region’s Top Employers.
Enjoy a career you can be proud of by helping our learners become the leaders of tomorrow. We are looking for part-time faculty members in the following programs:
• Aviation Management – General Arts and Science
• Computer Engineering Technology – Computing Science
• Electro-Mechanical Engineering Technician
• Manufacturing Engineering Technician
• Mechanical Engineering Technology
• Computer Programmer
• Computer Systems Technician
• Computer Systems Technology – Security
• Bachelor of Information Technology – Network Technology
Speaker 1: Hisham Abed, P.Eng., Ericsson
Topic:Â Power Integrity – Best design practices
Speaker 2: Dr. Ihsan Erdin, Celestica
Topic:Â Power Integrity Optimization amidst MLCC shortage
Parking:Â Free
Registration: Free, and is on a first to reply basis. Preference given to IEEE EMC and CPMT society members. Seating is limited. E-mail reservation is required.
Pizza and soft drinks will be served.
Organizer: Dr. Syed Bokhari, Chairman, IEEE Ottawa
EMC chapter
Syed.Bokhari@fidus.com,
Office :(613) 595 – 0507 Ext. 377, Cell: (613) 355 – 6632
Directions:Â Â Â www.fidus.com
IEEE Ottawa Section: MTT-S / AP-S Chapter presents:
Title: Characterization and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Date: September 2nd, 2020
Time: 11 AM (ET)
Register at: https://events.vtools.ieee.org/m/238482
This talk will review some recent advancements achieved on the characterization and modelling of the trapping effects felt in GaN HEMT transistors, and their impact on microwave circuit design. Because of their nowadays importance, a particular attention will be payed to applications on high power amplifiers for mobile wireless infrastructure and pulsed radar applications.
For that, the talk will start by recollecting the most common model formulations adopted for the various levels of RF engineering, from the device level (physics) to the transistor (circuit) and amplifier (system) level. Starting by the Shockley-Read-Hall capture and emission processes we will be able to understand one of the fundamental signatures of trapping effects, the significantly different charge and discharging time constants, and its impact on power amplifier nonlinear distortion behavior. Then, some widely adopted approaches of the channel current transients’ characterization are addressed and the talk concludes by presenting some illustrative cases of application to RF high power amplifiers.
Speaker: Jose C. Pedro
José C. Pedro received the Diploma, Ph.D., and Habilitation degrees in electronics and telecommunications engineering from the Universidade de Aveiro, Aveiro, Portugal, in 1985, 1993, and 2002, respectively.
He is currently a Full Professor with the Universidade de Aveiro and head of the Aveiro site of the Instituto de Telecomunicações. He has authored 2 books and authored or co-authored more than 200 papers in international journals and symposia. His current research interests include active device modelling and the analysis and design of various nonlinear microwave circuits.
Dr. Pedro was a recipient of various prizes including the 1993 Marconi Young Scientist Award, the 2000 Institution of Electrical Engineers Measurement Prize, the 2015 EuMC Best Paper Microwave Prize, and the Microwave Distinguished Educator Award. He has served the scientific community as a Reviewer and an Editor for several conferences and journals, namely, the IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, for which he was the Editor-in-Chief.